Inservice High Temprature UT/PAUT and ToFD/UTG

Inservice High Temprature UT/PAUT and ToFD/UTG

In-service high temperature ultrasonic testing (UT) and phased array ultrasonic testing (PAUT) with time-of-flight diffraction (ToFD) and ultrasonic thickness gauging (UTG) are advanced non-destructive testing (NDT) techniques used to assess the integrity and condition of components, structures, and materials operating at elevated temperatures. These techniques offer numerous advantages in detecting defects, measuring thickness, and ensuring the safety and reliability of assets in high temperature environments.

Applications of High Temprature UT/PAUT and ToFD/UTG :